Published in
Elsevier, Microelectronics Reliability, (76-77), p. 584-587, 2017
DOI: 10.1016/j.microrel.2017.06.043
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Long-term degradation of InGaN-based laser diodes: Role of defects
Journal article published in 2017 by
D. Monti 
,
M. Meneghini ,
C. De Santi,
G. Meneghesso,
E. Zanoni,
A. Bojarska ,
P. Perlin
,
M. Meneghini ,
C. De Santi,
G. Meneghesso,
E. Zanoni,
A. Bojarska ,
P. Perlin
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