Published in
Elsevier, Microelectronics Reliability, (76-77), p. 575-578, 2017
DOI: 10.1016/j.microrel.2017.06.072
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Degradation of InGaN-based MQW solar cells under 405 nm laser excitation
Journal article published in 2017 by
Carlo De Santi,
Matteo Meneghini 
,
A. Caria ,
E. Dogmus,
M. Zegaoui,
F. Medjdoub ,
Enrico Zanoni,
Gaudenzio Meneghesso
,
A. Caria ,
E. Dogmus,
M. Zegaoui,
F. Medjdoub ,
Enrico Zanoni,
Gaudenzio Meneghesso
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