Published in
Elsevier, Organic Electronics, (49), p. 375-381, 2017
DOI: 10.1016/j.orgel.2017.07.012
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Structural stability of naphthyl end-capped oligothiophenes in organic field-effect transistors measured by grazing-incidence X-ray diffraction in operando
Journal article published in 2017 by
Mathias K. Huss-Hansen,
Andreas E. Lauritzen,
Oier Bikondoa,
Mika Torkkeli,
Luciana Tavares,
Matti Knaapila,
Jakob Kjelstrup-Hansen 
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