Published in
Elsevier, Microelectronics Reliability, (76-77), p. 178-183
DOI: 10.1016/j.microrel.2017.06.088
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Identification of the generation/rupture mechanism of filamentary conductive paths in ReRAM devices using oxide failure analysis
Journal article published in 2017 by
A. Rodriguez-Fernandez 
,
C. Cagli,
L. Perniola,
J. Suñé,
E. Miranda
,
C. Cagli,
L. Perniola,
J. Suñé,
E. Miranda
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