Published in
Elsevier, Solar Energy Materials and Solar Cells, (187), p. 104-112, 2018
DOI: 10.1016/j.solmat.2018.07.024
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Multi-characterization study of interface passivation quality of amorphous sub-stoichiometric silicon oxide and silicon oxynitride layers for photovoltaic applications
Journal article published in 2018 by
Jonathan Steffens,
Maria Antonietta Fazio,
Daniela Cavalcoli 
,
Barbara Terheiden
,
Barbara Terheiden
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