Published in
Institute of Electrical and Electronics Engineers, IEEE Electron Device Letters, 10(38), p. 1394-1397, 2017
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The Origin of the High Off-State Current in p-Type Cu2O Thin Film Transistors
Journal article published in 2017 by
Sanggil Han 
,
Andrew J. Flewitt
,
Andrew J. Flewitt
This paper was not found in any repository, but could be made available legally by the author.
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