Published in
Elsevier, Microelectronics Reliability, (78), p. 38-45
DOI: 10.1016/j.microrel.2017.07.093
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Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources
Journal article published in 2017 by
D. Malagón,
S. A. Bota,
G. Torrens,
X. Gili,
J. Praena,
B. Fernández 
,
M. Macías,
J. M. Quesada,
Carlos Guerrero Sanchez,
M. C. Jiménez-Ramos,
J. García López,
J. L. Merino,
J. Segura
,
M. Macías,
J. M. Quesada,
Carlos Guerrero Sanchez,
M. C. Jiménez-Ramos,
J. García López,
J. L. Merino,
J. Segura
This paper is available in a repository.
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