Published in
Elsevier, Microelectronics Reliability, (81), p. 306-311
DOI: 10.1016/j.microrel.2017.10.006
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On the origin of dynamic Ron in commercial GaN-on-Si HEMTs
Journal article published in 2018 by
Serge Karboyan,
Michael J. Uren 
,
Manikant,
James W. Pomeroy,
Martin Kuball
,
Manikant,
James W. Pomeroy,
Martin Kuball
This paper was not found in any repository, but could be made available legally by the author.
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