Published in
Elsevier, Microelectronics Reliability, (80), p. 257-265
DOI: 10.1016/j.microrel.2017.11.004
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Positive and negative threshold voltage instabilities in GaN-based transistors
Journal article published in 2018 by
G. Meneghesso,
M. Meneghini 
,
C. De Santi,
M. Ruzzarin,
E. Zanoni
,
C. De Santi,
M. Ruzzarin,
E. Zanoni
This paper was not found in any repository, but could be made available legally by the author.
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