Published in
Elsevier, Microelectronics Reliability, (81), p. 181-185, 2018
DOI: 10.1016/j.microrel.2017.12.033
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Mechanical stress effects on electrical breakdown of freestanding GaN thin films
Journal article published in 2018 by
Tun Wang,
Baoming Wang 
,
Aman Haque ,
Michael Snure,
Eric Heller,
Nicholas Glavin
,
Aman Haque ,
Michael Snure,
Eric Heller,
Nicholas Glavin
This paper was not found in any repository, but could be made available legally by the author.
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