Published in
American Institute of Physics, Review of Scientific Instruments, 10(89), p. 10F107
DOI: 10.1063/1.5038809
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In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X
Journal article published in 2018 by
J. Kring,
N. Pablant 
,
A. Langenberg ,
J. Rice,
L. Delgado-Aparicio ,
D. Maurer ,
P. Traverso,
M. Bitter,
K. Hill,
M. Reinke
,
A. Langenberg ,
J. Rice,
L. Delgado-Aparicio ,
D. Maurer ,
P. Traverso,
M. Bitter,
K. Hill,
M. Reinke
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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