Published in
American Institute of Physics, Review of Scientific Instruments, 8(89), p. 084905
DOI: 10.1063/1.5037117
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High-frequency measurements of thermophysical properties of thin films using a modified broad-band frequency domain thermoreflectance approach
Journal article published in 2018 by
Mohammadreza Shahzadeh 
,
Mizanur Rahman,
Olav Hellwig,
Simone Pisana
,
Mizanur Rahman,
Olav Hellwig,
Simone Pisana
This paper was not found in any repository, but could be made available legally by the author.
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