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Elsevier, Applied Surface Science, (442), p. 759-766, 2018

DOI: 10.1016/j.apsusc.2018.02.219

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SPR sensors for monitoring the degradation processes of Eu(dbm)3(phen) and Alq3 thin films under atmospheric and UVA exposure

Journal article published in 2018 by T. Del Rosso ORCID, Q. Zaman ORCID, M. Cremona, O. Pandoli ORCID, A. R. J. Barreto
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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