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Elsevier, Organic Electronics, (57), p. 158-164

DOI: 10.1016/j.orgel.2018.03.010

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Comprehensive understanding of degradation mechanism of high efficiency blue organic light-emitting diodes at the interface by hole and electron transport layer

Journal article published in 2018 by Wook Song, Jun Yeob Lee ORCID, Taekyung Kim ORCID, Yoonkyoo Lee, Hyein Jeong
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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