Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Information Forensics and Security, 11(13), p. 2844-2855, 2018
DOI: 10.1109/tifs.2018.2832984
Links
- ORCID
- Institute of Electrical and Electronics Engineers
- [arxiv.org] | PDF
- [eprints.whiterose.ac.uk] | PDF
Tools
Analyzing and Patching SPEKE in ISO/IEC
Journal article published in 2018 by
Feng Hao 
,
Roberto Metere,
Siamak F. Shahandashti ,
Changyu Dong
,
Roberto Metere,
Siamak F. Shahandashti ,
Changyu Dong
This paper is available in a repository.
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