Published in
American Institute of Physics, Journal of Applied Physics, 16(123), p. 161576
DOI: 10.1063/1.5010965
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Effect of electron injection on defect reactions in irradiated silicon containing boron, carbon, and oxygen
Journal article published in 2018 by
L. F. Makarenko 
,
S. B. Lastovskii,
H. S. Yakushevich,
M. Moll ,
I. Pintilie
,
S. B. Lastovskii,
H. S. Yakushevich,
M. Moll ,
I. Pintilie
This paper is made freely available by the publisher.
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