Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nuclear Science, 2(63), p. 1294-1300, 2016
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Analysis of SRAM-Based FPGA SEU Sensitivity to Combined EMI and TID-Imprinted Effects
Journal article published in 2016 by
Juliano Benfica,
Bruno Green,
Bruno C. Porcher,
Leticia Bolzani Poehls,
Fabian Vargas,
Nilberto H. Medina 
,
Nemitala Added,
Vitor A. P. de Aguiar,
Eduardo L. A. Macchione,
Fernando Aguirre,
Marcilei A. G. Silveira,
Martin Perez,
Miguel Sofo Haro,
Ivan Sidelnik,
Jeronimo Blostein
and other authors.
,
Nemitala Added,
Vitor A. P. de Aguiar,
Eduardo L. A. Macchione,
Fernando Aguirre,
Marcilei A. G. Silveira,
Martin Perez,
Miguel Sofo Haro,
Ivan Sidelnik,
Jeronimo Blostein
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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