Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Nuclear Science, 1(64), p. 176-180, 2017
Links
Tools
Total Ionizing Dose (TID) Effects in Ultra-Thin Body Ge-on-Insulator (GOI) Junctionless CMOSFETs With Recessed Source/Drain and Channel
Journal article published in 2017 by
Shufeng Ren,
Maruf A. Bhuiyan 
,
Heng Wu,
Rong Jiang ,
Kai Ni ,
En Xia Zhang ,
Robert A. Reed,
Daniel M. Fleetwood,
Peide Ye,
T. P. Ma
,
Heng Wu,
Rong Jiang ,
Kai Ni ,
En Xia Zhang ,
Robert A. Reed,
Daniel M. Fleetwood,
Peide Ye,
T. P. Ma
This paper is made freely available by the publisher.
Full text: Download
Published version:
archiving forbidden
Data provided by 