Calibration and error analysis of metal-oxide-semiconductor field-effect transistor dosimeters for computed tomography radiation dosimetry
Journal article published in 2017 by
Sigal Trattner,
Peter Prinsen,
Jens Wiegert,
Elazar-Lars Gerland,
Efrat Shefer,
Tom Morton,
Carla M. Thompson,
Yoad Yagil,
Bin Cheng,
Sachin Jambawalikar 
,
Rani Al-Senan,
Maxwell Amurao,
Sandra S. Halliburton,
Andrew J. Einstein
,
Rani Al-Senan,
Maxwell Amurao,
Sandra S. Halliburton,
Andrew J. Einstein
This paper is made freely available by the publisher.
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