AbstractMolecular orientation in amorphous organic semiconducting thin‐film devices is an important issue affecting device performance. However, to date it has not been possible to analyze the “distribution” of the orientations. Although solid‐state NMR (ssNMR) spectroscopy can provide information on the “distribution” of molecular orientations, the technique is limited because of the small amount of sample in the device and the low sensitivity of ssNMR. Here, we report the first application of dynamic nuclear polarization enhanced ssNMR (DNP‐ssNMR) spectroscopy for the orientational analysis of amorphous phenyldi(pyren‐1‐yl)phosphine oxide (POPy₂). The ³¹P DNP‐ssNMR spectra exhibited a sufficient signal‐to‐noise ratio to quantify the distribution of molecular orientations in amorphous films: the P=O axis of the vacuum‐deposited and drop‐cast POPy₂ shows anisotropic and isotropic distribution, respectively. The different molecular orientations reflect the molecular origin of the different charge transport behaviors.