XPS study during a soft and progressive sputtering of a monolayer on indium phosphide by argon cluster bombardment
Journal article published in 2018 by
Damien Aureau 
,
Mathieu Frégnaux,
Christian Njel,
Jackie Vigneron,
Muriel Bouttemy,
Anne-Marie Gonçalves,
Arnaud Etcheberry
,
Mathieu Frégnaux,
Christian Njel,
Jackie Vigneron,
Muriel Bouttemy,
Anne-Marie Gonçalves,
Arnaud Etcheberry
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