Published in
2016 IEEE International Electron Devices Meeting (IEDM)
DOI: 10.1109/iedm.2016.7838514
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Compact models of negative-capacitance FinFETs: Lumped and distributed charge models
Proceedings article published in 2016 by
Juan P. Duarte,
Sourabh Khandelwal,
Asif I. Khan,
Angada Sachid,
Yen-Kai Lin,
Huan-Lin Chang 
,
Sayeef Salahuddin,
Chenming M. Hu,
Ieee
,
Sayeef Salahuddin,
Chenming M. Hu,
Ieee
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