Published in
Institute of Electrical and Electronics Engineers, IEEE Electron Device Letters, 7(39), p. 1022-1025, 2018
Links
Tools
Charge Trapping in Al2O3/-Ga2O3-Based MOS Capacitors
Journal article published in 2018 by
Maruf A. Bhuiyan 
,
Hong Zhou ,
Rong Jiang ,
En Xia Zhang ,
Daniel M. Fleetwood ,
Peide D. Ye ,
Tso-Ping Ma
,
Hong Zhou ,
Rong Jiang ,
En Xia Zhang ,
Daniel M. Fleetwood ,
Peide D. Ye ,
Tso-Ping Ma
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 