Published in
American Institute of Physics, Applied Physics Letters, 4(112), p. 043102
DOI: 10.1063/1.4998712
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High resolution thickness measurements of ultrathin Si:P monolayers using weak localization
Journal article published in 2018 by
Joseph A. Hagmann 
,
Xiqiao Wang,
Pradeep Namboodiri,
Jonathan Wyrick,
Roy Murray,
M. D. Stewart,
Richard M. Silver,
Curt A. Richter
,
Xiqiao Wang,
Pradeep Namboodiri,
Jonathan Wyrick,
Roy Murray,
M. D. Stewart,
Richard M. Silver,
Curt A. Richter
This paper was not found in any repository, but could be made available legally by the author.
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