Published in
American Institute of Physics, Journal of Applied Physics, 12(123), p. 125701
DOI: 10.1063/1.5019470
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Diagnosis of phosphorus monolayer doping in silicon based on nanowire electrical characterisation
Journal article published in 2018 by
Ray Duffy 
,
Alessio Ricchio ,
Ruaidhrí Murphy ,
Graeme Maxwell,
Richard Murphy,
Guido Piaszenski,
Nikolay Petkov,
Alan Hydes,
Dan O'Connell ,
Colin Lyons ,
Noel Kennedy,
Brendan Sheehan,
Michael Schmidt ,
Felice Crupi ,
Justin D. Holmes
and other authors.
,
Alessio Ricchio ,
Ruaidhrí Murphy ,
Graeme Maxwell,
Richard Murphy,
Guido Piaszenski,
Nikolay Petkov,
Alan Hydes,
Dan O'Connell ,
Colin Lyons ,
Noel Kennedy,
Brendan Sheehan,
Michael Schmidt ,
Felice Crupi ,
Justin D. Holmes
and other authors.
This paper is made freely available by the publisher.
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