Published in
American Association for the Advancement of Science, Science Advances, 6(3), 2017
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Nondestructive imaging of atomically thin nanostructures buried in silicon
Journal article published in 2017 by
Georg Gramse,
Alexander Kölker,
Tingbin Lim,
Taylor J. Z. Stock 
,
Hari Solanki,
Steven R. Schofield ,
Enrico Brinciotti ,
Gabriel Aeppli,
Ferry Kienberger ,
Neil J. Curson
,
Hari Solanki,
Steven R. Schofield ,
Enrico Brinciotti ,
Gabriel Aeppli,
Ferry Kienberger ,
Neil J. Curson
This paper is made freely available by the publisher.
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Abstract
Microwave microscopy enables three-dimensional characterization of atomically thin semiconductor structures with nanometer precision.