Published in
American Institute of Physics, Review of Scientific Instruments, 1(88), p. 015001
DOI: 10.1063/1.4973512
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Three-point bending setup for piezoresistive gauge factor measurement of thin-film samples at high temperatures
Journal article published in 2017 by
Nis Dam Madsen,
Jakob Kjelstrup-Hansen 
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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