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Elsevier, Spectrochimica Acta Part B: Atomic Spectroscopy, (135), p. 34-41

DOI: 10.1016/j.sab.2017.06.016

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Evaluation of different strategies for quantitative depth profile analysis of Cu/NiCu layers and multilayers via pulsed glow discharge – Time of flight mass spectrometry

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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