Published in
Copernicus Publications, Geoscientific Instrumentation, Methods and Data Systems Discussions, p. 1-12
DOI: 10.5194/gi-2018-20
Links
Tools
Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopic analysis
Journal article published in 2018 by
Dorothea S. Macholdt,
Christopher Pöhlker,
Jan-David Förster 
,
Maren Müller,
Bettina Weber ,
Michael Kappl,
A. L. David Kilcoyne ,
Markus Weigand,
Klaus Peter Jochum,
Meinrat O. Andreae
,
Maren Müller,
Bettina Weber ,
Michael Kappl,
A. L. David Kilcoyne ,
Markus Weigand,
Klaus Peter Jochum,
Meinrat O. Andreae
This paper is made freely available by the publisher.
Full text: Download
Data provided by 