Published in
European Microscopy Congress 2016: Proceedings, p. 1000-1001
DOI: 10.1002/9783527808465.emc2016.5090
Oxford University Press (OUP), Microscopy, suppl_1(67), p. i60-i71
Links
Tools
Convergent-beam EMCD: benefits, pitfalls and applications
Journal article published in 2016 by
Stefan Löffler 
,
Walid Hetaba
,
Walid Hetaba
