Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 3(65), p. 970-977, 2018
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Investigation of Preexisting and Generated Defects in Nonfilamentary a-Si/TiO2 RRAM and Their Impacts on RTN Amplitude Distribution
Journal article published in 2018 by
Jigang Ma,
Zheng Chai 
,
Wei Dong Zhang ,
Jian Fu Zhang ,
Zhigang Ji ,
Brahim Benbakhti ,
Bogdan Govoreanu,
Eddy Simoen ,
Ludovic Goux,
Attilio Belmonte,
Robin Degraeve,
Gouri Sankar Kar,
Malgorzata Jurczak
,
Wei Dong Zhang ,
Jian Fu Zhang ,
Zhigang Ji ,
Brahim Benbakhti ,
Bogdan Govoreanu,
Eddy Simoen ,
Ludovic Goux,
Attilio Belmonte,
Robin Degraeve,
Gouri Sankar Kar,
Malgorzata Jurczak
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