Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 6(65), p. 2446-2453, 2018
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Electron Trapping in Extended Defects in Microwave AlGaN/GaN HEMTs With Carbon-Doped Buffers
Journal article published in 2018 by
Johan Bergsten 
,
Mattias Thorsell ,
David Adolph,
Jr-Tai Chen,
Olof Kordina,
Einar O. Sveinbjornsson,
Niklas Rorsman
,
Mattias Thorsell ,
David Adolph,
Jr-Tai Chen,
Olof Kordina,
Einar O. Sveinbjornsson,
Niklas Rorsman
This paper was not found in any repository, but could be made available legally by the author.
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