Published in
American Institute of Physics, APL Materials, 6(6), p. 069901
DOI: 10.1063/1.5037455
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Publisher’s Note: “Structural analysis of LaVO3 thin films under epitaxial strain” [APL Materials 6, 046102 (2018)]
Journal article published in 2018 by
H. Meley 
,
Karandeep,
L. Oberson ,
J. de Bruijckere,
D. T. L. Alexander ,
J.-M. Triscone,
P.-H. Ghosez,
S. Gariglio
,
Karandeep,
L. Oberson ,
J. de Bruijckere,
D. T. L. Alexander ,
J.-M. Triscone,
P.-H. Ghosez,
S. Gariglio
This paper is made freely available by the publisher.
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