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American Chemical Society, Journal of Combinatorial Chemistry, 4(4), p. 255-257, 2002

DOI: 10.1021/cc020002a

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Application of x-ray photoelectron spectroscopy in determining the structure of solid-phase bound substrates

This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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Abstract

The synthesis of compounds on solid supports has grown rapidly in the past 10 years, but one of the hurdles to the routine adoption of solid-supported chemistry is the limited number of analytical methods available to characterize resin-bound compounds. There have been methods developed for on-bead reaction monitoring of solid-phase reactions; both magic angle spinning (MAS) NMR1 and FTIR2 are useful techniques, but much solid-phase chemistry still relies on releasing the product from the solid support for validation. As a result, there still remains the need for complementary techniques that could quantify and/or identify functional groups prepared during solid-phase synthesis.