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Elsevier, Postharvest Biology and Technology

DOI: 10.1016/j.postharvbio.2018.05.020

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Combination of shape and X-ray inspection for apple internal quality control: in silico analysis of the methodology based on X-ray computed tomography

Journal article published in 2018 by M. van Dael, P. Verboven ORCID, A. Zanella, J. Sijbers, B. Nicolai ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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