Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Industrial Electronics, 3(65), p. 2518-2524, 2018
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Closed-Loop Compensation of Charge Trapping Induced by Ionizing Radiation in MOS Capacitors
Journal article published in 2018 by
Manuel Dominguez-Pumar 
,
Chenna Reddy Bheesayagari,
Sergi Gorreta,
Gema Lopez-Rodriguez,
Joan Pons-Nin
,
Chenna Reddy Bheesayagari,
Sergi Gorreta,
Gema Lopez-Rodriguez,
Joan Pons-Nin
This paper is available in a repository.
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