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American Chemical Society, Analytical Chemistry, 21(89), p. 11875-11880, 2017

DOI: 10.1021/acs.analchem.7b03871

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An Accurate Model for the Ion Current–Distance Behavior in Scanning Ion Conductance Microscopy Allows for Calibration of Pipet Tip Geometry and Tip–Sample Distance

Journal article published in 2017 by Johannes Rheinlaender ORCID, Tilman E. Schäffer ORCID
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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