Published in
Institute of Electrical and Electronics Engineers, IEEE Electron Device Letters, 9(38), p. 1216-1219, 2017
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Experimental Observation of Negative Susceptance in HfO2-Based RRAM Devices
Journal article published in 2017 by
S. Duenas 
,
H. Castan,
H. Garcia,
Oscar G. Ossorio,
Luis A. Dominguez,
E. Miranda
,
H. Castan,
H. Garcia,
Oscar G. Ossorio,
Luis A. Dominguez,
E. Miranda
This paper was not found in any repository, but could be made available legally by the author.
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