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IOP Publishing, Applied Physics Express, 1(11), p. 011301, 2017

DOI: 10.7567/apex.11.011301

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Exceptional cracking behavior in H-implanted Si/B-doped Si0.70Ge0.30/Si heterostructures

Journal article published in 2017 by Da Chen ORCID, Dadi Wang ORCID, Yongwei Chang ORCID, Ya Li ORCID, Rui Ding ORCID, Jiurong Li ORCID, Xiao Chen ORCID, Gang Wang ORCID, Qinglei Guo ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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