Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 8(64), p. 3126-3131, 2017
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Instability of Dynamic- $R_{\text ON}$ and Threshold Voltage in GaN-on-GaN Vertical Field-Effect Transistors
Journal article published in 2017 by
M. Ruzzarin 
,
M. Meneghini ,
D. Bisi,
M. Sun ,
T. Palacios,
G. Meneghesso,
E. Zanoni
,
M. Meneghini ,
D. Bisi,
M. Sun ,
T. Palacios,
G. Meneghesso,
E. Zanoni
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