Published in
Institute of Electrical and Electronics Engineers, IEEE Electron Device Letters, 2(39), p. 176-179, 2018
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Carrier Mobility Enhancement by Applying Back-Gate Bias in Ge-on-Insulator MOSFETs
Journal article published in 2018 by
Wangran Wu,
Heng Wu,
Jingyun Zhang,
Mengwei Si 
,
Yi Zhao ,
Peide D. Ye
,
Yi Zhao ,
Peide D. Ye
This paper was not found in any repository, but could be made available legally by the author.
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