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IOP Publishing, Nanotechnology, 1(29), p. 015702, 2017

DOI: 10.1088/1361-6528/aa98ed

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Contamination-free Ge-based graphene as revealed by graphene enhanced secondary ion mass spectrometry (GESIMS)

Journal article published in 2017 by P. P. Michałowski ORCID, I. Pasternak ORCID, W. Strupiński
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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