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IOP Publishing, Measurement Science and Technology, 6(28), p. 065006

DOI: 10.1088/1361-6501/aa62e2

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Application of an atomic force microscope piezocantilever for dilatometry under extreme conditions

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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