Published in
2017 18th IEEE Latin American Test Symposium (LATS)
DOI: 10.1109/latw.2017.7906772
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Analysis of single-event upsets in a Microsemi ProAsic3E FPGA
Journal article published in 2017 by
Paulo R. C. Villa,
Roger C. Goerl,
Fabian Vargas,
Leticia B. Poehls,
Nilberto H. Medina 
,
Nemitala Added,
Vitor A. P. de Aguiar,
Eduardo L. A. Macchione,
Fernando Aguirre,
Marcilei A. G. da Silveira,
Eduardo A. Bezerra,
Ieee
,
Nemitala Added,
Vitor A. P. de Aguiar,
Eduardo L. A. Macchione,
Fernando Aguirre,
Marcilei A. G. da Silveira,
Eduardo A. Bezerra,
Ieee
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