Published in

2016 IEEE MTT-S Latin America Microwave Conference (LAMC)

DOI: 10.1109/lamc.2016.7851268

Links

Tools

Export citation

Search in Google Scholar

A holistic methodology for system margining and jitter tolerance optimization in post-silicon validation

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Green circle
Postprint: archiving allowed
Red circle
Published version: archiving forbidden
Data provided by SHERPA/RoMEO