Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 9(36), p. 1545-1556, 2017
DOI: 10.1109/tcad.2016.2638440
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Improved Tangent Space-Based Distance Metric for Lithographic Hotspot Classification
Journal article published in 2017 by
Fan Yang 
,
Subarna Sinha,
Charles C. Chiang,
Xuan Zeng,
Dian Zhou
,
Subarna Sinha,
Charles C. Chiang,
Xuan Zeng,
Dian Zhou
This paper is made freely available by the publisher.
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