Published in
Institute of Electrical and Electronics Engineers, IEEE Electron Device Letters, 12(37), p. 1578-1581, 2016
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Effect of SiO2 Buffer Layer Thickness on Performance and Reliability of Flexible Polycrystalline Silicon TFTs Fabricated on Polyimide
Journal article published in 2016 by
Bo-Wei Chen,
Ting-Chang Chang 
,
Yu-Ju Hung,
Shin-Ping Huang,
Hua-Mao Chen,
Hui-Chun Huang,
Po-Yung Liao,
Hsiao-Cheng Chiang,
Yu-Zhe Zheng,
Wei-Heng Yeh,
Yu-Ho Lin,
Jonathan Siher Liang,
Ann-Kuo Chu,
Hung-Wei Li,
Chih-Hung Tsai
and other authors.
,
Yu-Ju Hung,
Shin-Ping Huang,
Hua-Mao Chen,
Hui-Chun Huang,
Po-Yung Liao,
Hsiao-Cheng Chiang,
Yu-Zhe Zheng,
Wei-Heng Yeh,
Yu-Ho Lin,
Jonathan Siher Liang,
Ann-Kuo Chu,
Hung-Wei Li,
Chih-Hung Tsai
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
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