Published in
2016 46th European Solid-State Device Research Conference (ESSDERC)
DOI: 10.1109/essderc.2016.7599607
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Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs
Proceedings article published in 2016 by
R. Lavieville,
T. Karatsori,
C. Theodorou 
,
S. Barraud,
C. A. Dimitriadis,
G. Ghibaudo
,
S. Barraud,
C. A. Dimitriadis,
G. Ghibaudo
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