Published in
American Institute of Physics, Journal of Applied Physics, 3(120), p. 035702
DOI: 10.1063/1.4956436
Links
Tools
Electro- and photoluminescence imaging as fast screening technique of the layer uniformity and device degradation in planar perovskite solar cells
Journal article published in 2016 by
Arman Mahboubi Soufiani,
Murad J. Y. Tayebjee 
,
Steffen Meyer,
Anita Ho-Baillie,
Jae Sung Yun,
Rowan W. MacQueen ,
Leone Spiccia,
Martin A. Green,
Ziv Hameiri
,
Steffen Meyer,
Anita Ho-Baillie,
Jae Sung Yun,
Rowan W. MacQueen ,
Leone Spiccia,
Martin A. Green,
Ziv Hameiri
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Data provided by 