Published in
American Institute of Physics, Applied Physics Letters, 1(109), p. 013103
DOI: 10.1063/1.4955404
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Quantifying the intrinsic surface charge density and charge-transfer resistance of the graphene-solution interface through bias-free low-level charge measurement
Journal article published in 2016 by
Jinglei Ping,
A. T. Charlie Johnson 
This paper is available in a repository.
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